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Features
* * * * * * * * * *
Contactless Power Supply Contactless Read/Write Data Transmission Radio Frequency fRF from 100 kHz to 150 kHz Basic Mode or Extended Mode Compatible with T5557, ATA5567 Replacement for e5551/T5551 in Most Common Operation Modes Configurable for ISO/IEC 11784/785 Compatibility Total 363 Bits EEPROM Memory: 11 Blocks (32 Bits + 1 Lock Bit) High Q-antenna Tolerance Due to Build in Options Adaptable to Different Applications: Access Control, Animal ID and Waste Management * On-chip Trimmed Antenna Capacitor * Pad Options - ATA5577M1 * 100 m x 100 m for Wire Bonding or Flip Chip - ATA5577M2 * 200 m x 400 m for Direct Coil Bonding
Read/Write LF RFID IDIC 100 to 150 kHz ATA5577 Summary
1. Description
The ATA5577 is a contactless read/write identification IC (IDIC ) for applications in the 125-kHz or 134-kHz frequency band. A single coil connected to the chip serves as the IC's power supply and bi-directional communication interface. The antenna and chip together form a transponder or tag. The on-chip 363-bit EEPROM (11 blocks with 33 bits each) can be read and written block-wise from a base station (reader). Data is transmitted from the IDIC (uplink) using load modulation. This is achieved by damping the RF field with a resistive load between the two terminals Coil 1 and Coil 2. The IC receives and decodes serial base station commands (downlink), which are encoded as 100% amplitude modulated (OOK) pulse-interval-encoded bit streams. A complete datasheet with further technical data is available on request. Please contact your local sales office.
(R)
Preliminary
NOTE: This is a summary document. The complete document is available. For more information, please contact your local Atmel sales office.
4967DS-RFID-10/08
2. Compatibility
The ATA5577 is designed to be compatible with the T5557/ATA5567. The structure of the configuration register is identical. The two modes, Basic mode and Extended mode, are also available. The ATA5577 is able to replace the e5551/T5551 in most common operation modes. In all applications, the correct functionality of the replacements must be evaluated and proved. For further details, refer to Atmel(R)'s web site for product-relevant application notes.
3. System Block Diagram
Figure 3-1. RFID System Using ATA5577 Tag
Transponder Power Reader or Base station
Coil interface
Controller
Memory
Data
1)
ATA5577
1) Mask option
4. ATA5577 - Functional Blocks
Figure 4-1. Block Diagram
Option register
Modulator
POR
Coil 1
Analog front end
Mode register Write decoder Memory (363-bit EEPROM) Controller
1)
Coil 2
Data-rate generator
Input register
Test logic
HV generator
1) Mask option
2
ATA5577 [Preliminary]
4967DS-RFID-10/08
ATA5577 [Preliminary]
4.1 Analog Front End (AFE)
The AFE includes all circuits that are directly connected to the coil terminals. It generates the IC's power supply and handles the bi-directional data communication with the reader. It consists of the following blocks: * Rectifier to generate a DC supply voltage from the AC coil voltage * Clock extractor * Switchable load between Coil 1 and Coil 2 for data transmission from the tag to the reader * Field-gap detector for data transmission from the base station to the tag * ESD-protection circuitry
4.2
Data-rate Generator
The data rate is binary programmable to operate at any even-numbered data rate between RF/2 and RF/128 or to any of the fixed Basic mode data rates (RF/8, RF/16, RF/32, RF/40, RF/50, RF/64, RF/100 and RF/128).
4.3
Write Decoder
The write decoder detects the write gaps and verifies the validity of the data stream according to the Atmel e555x downlink protocol (pulse interval encoding).
4.4
HV Generator
This on-chip charge pump circuit generates the high voltage required to program the EEPROM.
4.5
DC Supply
Power is externally supplied to the IDIC via the two coil connections. The IC rectifies and regulates this RF source and uses it to generate its supply voltage.
4.6
Power-On Reset (POR)
The power-on reset circuit blocks the voltage supply to the IDIC until an acceptable voltage threshold has been reached.
4.7
Clock Extraction
The clock extraction circuit uses the external RF signal as its internal clock source.
4.8
Controller
The control logic module executes the following functions: * Load mode register with configuration data from EEPROM block 0 after power-on and during reading * Load option register with the settings for the analog front end stored in EEPROM page 1 block 3 after power-on and during reading * Control all EEPROM memory read/write access and data protection * Handles the downlink command decoding detecting protocol violations and error conditions
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4967DS-RFID-10/08
4.9
Mode Register
The mode register maintains a readable shadow copy of the configuration data held in block 0 of the EEPROM. It is continually refreshed during read mode and (re-)loaded after every POR event or reset command. On delivery, the mode register is pre-programmed with default values (see full version of the datasheet).
4.10
Modulator
The modulator encodes the serialized EEPROM data for transmission to a tag reader or base station. Several types of modulation are available including Manchester, bi-phase, FSK, PSK, and NRZ.
4.11
Memory
Figure 4-2.
0 L Page 1 1 1 L L L L Page 0 L L L L L
Memory Map
1.........................................................................................32 Analog front end option set-up Traceability data Traceability data Page 0 configuration data User data or password User data User data User data User data User data User data Configuration data 32 bits Block 3 Block 2 Block 1 Block 0 Block 7 Block 6 Block 5 Block 4 Block 3 Block 2 Block 1 Block 0
Not transmitted
The memory is a 363-bit EEPROM, which is arranged in 11 blocks of 33 bits each. Each block includes a single Lock bit, which is responsible for write-protecting the associated block. Programming takes place on a block basis, so a complete block (including lock bit) can be programmed with a single command. The memory is subdivided into two page areas. Page 0 contains 8 blocks and page 1 contains 4 blocks. All 33 bits of a block, including the lock bit, are programmed simultaneously.
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ATA5577 [Preliminary]
4967DS-RFID-10/08
ATA5577 [Preliminary]
Block 0 of page 0 contains the mode/configuration data, which is not transmitted during regular read operations. Addressing block 0 will always affect block 0 of page 0 regardless of the page selector. Block 7 of page 0 may be used as a write-protection password. Block 3 of page 1 contains the option register, which is not transmitted during regular-read operation. Bit 0 of every block is the lock bit for that block. Once locked, the block (including the lock bit itself) is not re-programmable via the RF field. Blocks 1 and 2 of page 1 contain traceability data and are transmitted with the modulation parameters defined in the configuration register after the opcode "11" is issued by the reader. The traceability data blocks are programmed and locked by Atmel.
5. Absolute Maximum Ratings
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Parameters Maximum DC current into Coil1/Coil2 Maximum AC current into Coil1/Coil2, f = 125 kHz Power dissipation (die) (free-air condition, time of application: 1s) Electrostatic discharge maximum to ANSI/ESD-STM5.1-2001 standard (HBM) Operating ambient temperature range Storage temperature range (data retention reduced) Symbol Icoil Icoil p Ptot Vmax Tamb Tstg Value 20 (TBD) 20 (TBD) 100 (TBD) 2000 (TBD) -40 to +85 -40 to +150 Unit mA mA mW V C C
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4967DS-RFID-10/08
6. Electrical Characteristics
Tamb = +25C; fcoil = 125 kHz; unless otherwise specified No. 1 2.1 2.2 2.3 3.1 3.2 3.3 4 5.1 5.2 5.3 5.4 6.1 6.2 6.3 6.4 6.5 7.1 7.2 7.3 7.4 7.5 7.6 Thermal stability Clock detection level (depends on settings in option register) Gap detection level (depends on settings in option register) Vcoil pp = 8V Modulation parameters (depends on settings in option register) 3-mA current into Clamp voltage (depends Coil1/Coil2 on settings in option register) 20-mA current into Coil1/Coil2 3-mA current into Coil1/Coil2 and modulation ON 20 mA current into Coil1/Coil2 and modulation ON Start-up time Parameters RF frequency range Tamb = 25C
(1)
Test Conditions
Symbol fRF
Min. 100
Typ. 125 1.5
Max. 150 TBD TBD TBD TBD Vclamp Vclamp
Unit kHz A A A V V V ms V V V V V V V V mV/C
Type* T Q Q Q Q Q Q Q Q T T T Q Q T Q Q T Q Q T Q
Supply current (without Read - full temperature current consumed by the range external LC tank circuit) Programming - full temperature range POR threshold (50-mV hysteresis) Coil voltage (AC supply) Read mode and write command(2) Program EEPROM(2) Vcoil pp = 6V
IDD
2 25 TBD 3.6
Vcoil pp
6 8
tstartup Vpp clamp lo Vpp clamp med Vpp clamp hi Vpp clamp med Vpp mod lo Vpp mod med Vpp mod hi Vpp mod med Vmod lo/Tamb Vclkdet lo Vclkdet med Vclkdet hi Vgapdet lo TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD
2.5 11 13 17 15 3 5 7 7.5 -1 250 550 800 250 550 850
TBD TBD TBD TBD TBD TBD TBD TBD TBD
TBD TBD TBD TBD TBD TBD
mV mV mV mV mV mV
Vcoil pp = 8 V From last command gap to re-enter read mode (64 + 648 internal clocks) Erase all/Write all(3)
Vgapdet med Vgapdet hi Tprog ncycle
8
Programming time
5
5.7
6
ms
T
9 Notes:
Endurance
100000
Cycles
Q
*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data 1. IDD measurement set-up R = 100k; VCLK = Vcoil = 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation defeat. IDD = (VOUTmax - VCLK) / R 2. Current into Coil1/Coil2 is limited to 10 mA. 3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on uncut wafer) delivery.
6
ATA5577 [Preliminary]
4967DS-RFID-10/08
ATA5577 [Preliminary]
6. Electrical Characteristics (Continued)
Tamb = +25C; fcoil = 125 kHz; unless otherwise specified No. 10.1 10.2 10.3 11.1 11.2 11.3 11.4 11.5 12.1 12.2 Notes: Micromodule capacitor parameters Capacitance tolerance Tamb Temperature coefficient Cr TBD Resonance capacitor Mask option Vcoil pp = 1V Cr Data retention Parameters Test Conditions Top = 55C
(3) (3) (3)
Symbol tretention tretention tretention
Min. 10 96 24 320 242 TBD TBD TBD 320 TBD
Typ. 20
Max. 50
Unit Years hrs hrs
Type* Q T Q T
Top = 150C Top = 250C
330 250 130 75 10 330 TBD
340 258 TBD TBD TBD 340 TBD pF TBD pF
Q T TBD
*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data 1. IDD measurement set-up R = 100k; VCLK = Vcoil = 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation defeat. IDD = (VOUTmax - VCLK) / R 2. Current into Coil1/Coil2 is limited to 10 mA. 3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on uncut wafer) delivery.
7. Revision History
Please note that the following page numbers referred to in this section refer to the specific revision mentioned, not to this document. Revision No. 4967DS-RFID-10/08 4967CS-RFID-01/08 History * Features on page 1 changed * Features on page 1 changed * Section 2 "Compatibility" on page 2 changed * Section 4.9 "Mode Register" on page 4 changed * * * * Put datasheet in a new template Section 4.2 "Data-rate Generator" on page 3 changed Figure 4-2 "Memory Map" on page 5 changed Section 6 "Electrical Characteristics" numbers 2.1, 2.2 and 2.3 on page 6 changed
4967BS-RFID-09/07
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4967DS-RFID-10/08
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4967DS-RFID-10/08

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